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DATE
2006
IEEE
151views Hardware» more  DATE 2006»
10 years 7 months ago
Designing MRF based error correcting circuits for memory elements
As devices are scaled to the nanoscale regime, it is clear that future nanodevices will be plagued by higher soft error rates and reduced noise margins. Traditional implementation...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
VTS
2007
IEEE
129views Hardware» more  VTS 2007»
10 years 7 months ago
Supply Voltage Noise Aware ATPG for Transition Delay Faults
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
books