ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
This paper accurately considers wire short defects and proposes an algorithm to guarantee IC chip yield rate improvement for redundant wire insertion. Without considering yield ra...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
Based on the insertion of internal and external redundant wires into L-type and U-type wires, an efficient two-phase reliability-driven insertion algorithm is proposed to insert r...