ATS
2004
IEEE
13 years 8 months ago
2004
IEEE
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in futu...
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper presents a new blocking logic to block unknowns for temporal compactors. The proposed blocking logic can reduce data volume required to control the blocking logic and a...