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TCAD
2011
8 years 2 months ago
Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Zhig...
TCAD
1998
91views more  TCAD 1998»
8 years 7 months ago
Cost-free scan: a low-overhead scan path design
Conventional scan design imposes considerable area and delay overhead by using larger scan ip- ops and additional scan wires without utilizing the functionality of the combinatio...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Mike Ti...
DAC
1996
ACM
8 years 11 months ago
Test Point Insertion: Scan Paths through Combinational Logic
We propose a low-overhead scan design methodology which employs a new test point insertion technique to establish scan paths through the functional logic. The technique re-uses th...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Kwang-T...
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