DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
Abstract— In this paper, we introduce a novel preimage computation technique that directly computes the circuit cofactors without an explicit search for any satisfiable solution...