Sciweavers

    MR
    2007
    144views Robotics» more  MR 2007»
    Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions
    13 years 4 months ago
    Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions
    Download  hal.archives-ouvertes.fr
    Two extreme configurations under short circuit conditions leading to the punch through Trench IGBT failure under the effect of the temperature and the gate resistance have been st...
    A. Benmansour, Stephane Azzopardi, J. C. Martin, E...
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2024, USA.