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DATE
2000
IEEE
65views Hardware» more  DATE 2000»
13 years 9 months ago
Test Quality and Fault Risk in Digital Filter Datapath BIST
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
Laurence Goodby, Alex Orailoglu