ASPLOS
2006
ACM
13 years 10 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...