ASYNC
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper addresses the issue of Single-Event Upset (SEU) in quasi delay-insensitive (QDI) asynchronous circuits. We show that an SEU can cause abnormal computations in QDI circu...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
In this paper, we describe and discuss the effects of design parameters such as transistor size, output voltage swing and bias current on radiation sensitivity of MOS current mode...