IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
DFT
2005
IEEE
13 years 10 months ago
2005
IEEE
SRAM-based Field Programmable Gate Arrays (FPGAs) are very susceptible to Single Event Upsets (SEUs) that may have dramatic effects on the circuits they implement. In this paper w...
ISQED
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
IPPS
2006
IEEE
13 years 10 months ago
2006
IEEE
The performance requirements for contemporary microprocessors are increasing as rapidly as their number of applications grows. By accelerating the clock, performance can be gained...
IPPS
2007
IEEE
13 years 10 months ago
2007
IEEE
Technology trends are such that single event effects (SEE)are likely to become even more of a concern for the future. Decreasing feature sizes, lower operating voltage, and higher...
DAC
2008
ACM
14 years 5 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...