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    DATE
    2006
    IEEE
    89views Hardware» more  DATE 2006»
    Generation of broadside transition fault test sets that detect four-way bridging faults
    13 years 11 months ago
    Generation of broadside transition fault test sets that detect four-way bridging faults
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    Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...
    Irith Pomeranz, Sudhakar M. Reddy
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