DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
ICIP
2001
IEEE
14 years 6 months ago
2001
IEEE
In this paper, generalized granulometric size distributions and size histograms (a.k.a `pattern spectra') are developed using generalized multiscale lattice operators of the ...