SDM
2007
SIAM
13 years 5 months ago
2007
SIAM
A frequently encountered problem in decision making is the following review problem: review a large number of objects and select a small number of the best ones. An example is sel...
SAS
2000
Springer
13 years 8 months ago
2000
Springer
Abstract. It is often the case at runtime that variables and registers in programs are "quasi-invariant," i.e., the distribution of the values they take on is very skewed...
BPM
2006
Springer
13 years 8 months ago
2006
Springer
Complexity has undesirable effects on, among others, the correctness, maintainability, and understandability of business process models. Yet, measuring complexity of business proce...
VRST
1997
ACM
13 years 8 months ago
1997
ACM
We present a new method for rendering novel images of flexible 3D objects from a small number of example images in correspondence. The strength of the method is the ability to sy...
FOCS
1999
IEEE
13 years 8 months ago
1999
IEEE
We study the phenomenon of cognitive learning from an algorithmic standpoint. How does the brain effectively learn concepts from a small number of examples despite the fact that e...
3DPVT
2002
IEEE
13 years 9 months ago
2002
IEEE
Three-dimensional modeling from images, when carried out entirely by a human, can be time consuming and impractical for large-scale projects. On the other hand, full automation ma...
KCAP
2009
ACM
13 years 11 months ago
2009
ACM
The extensive work on Knowledge Engineering in the 1990s has resulted in a systematic analysis of task-types, and the corresponding problem solving methods that can be deployed fo...
GLOBECOM
2009
IEEE
13 years 11 months ago
2009
IEEE
—In this paper we look at the problem of accurately reconstructing distributed signals through the collection of a small number of samples at a data gathering point. The techniqu...
CVPR
2009
IEEE
13 years 11 months ago
2009
IEEE
Landmark labeling of training images is essential for many learning tasks in computer vision, such as object detection, tracking, and alignment. Image labeling is typically conduc...
ICCAD
2002
IEEE
14 years 1 months ago
2002
IEEE
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspecific spectral information in th...