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    2007
    IEEE
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    An Analysis of Microarchitecture Vulnerability to Soft Errors on Simultaneous Multithreaded Architectures
    13 years 11 months ago
    An Analysis of Microarchitecture Vulnerability to Soft Errors on Simultaneous Multithreaded Architectures
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    Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
    Wangyuan Zhang, Xin Fu, Tao Li, José A. B. ...
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