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USENIX
2007
9 years 4 months ago
A Memory Soft Error Measurement on Production Systems
Memory state can be corrupted by the impact of particles causing single-event upsets (SEUs). Understanding and dealing with these soft (or transient) errors is important for syste...
Xin Li, Kai Shen, Michael C. Huang, Lingkun Chu
ISCAS
2003
IEEE
172views Hardware» more  ISCAS 2003»
9 years 7 months ago
Performance modeling of resonant tunneling based RAMs
Tunneling based random-access memories (TRAM’s) have recently garnered a great amount of interests among the memory designers due to their intrinsic merits such as reduced power...
Hui Zhang, Pinaki Mazumder, Li Ding 0002, Kyoungho...
FPGA
2005
ACM
105views FPGA» more  FPGA 2005»
9 years 8 months ago
Soft error rate estimation and mitigation for SRAM-based FPGAs
FPGA-based designs are more susceptible to single-event upsets (SEUs) compared to ASIC designs. Soft error rate (SER) estimation is a crucial step in the design of soft error tole...
Ghazanfar Asadi, Mehdi Baradaran Tahoori
ISCAS
2005
IEEE
129views Hardware» more  ISCAS 2005»
9 years 8 months ago
An analytical approach for soft error rate estimation in digital circuits
—Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital systems, which increase exponentially with Moore’s law. The first step in develo...
Ghazanfar Asadi, Mehdi Baradaran Tahoori
ISQED
2007
IEEE
148views Hardware» more  ISQED 2007»
9 years 8 months ago
On Accelerating Soft-Error Detection by Targeted Pattern Generation
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
ISCAS
2007
IEEE
173views Hardware» more  ISCAS 2007»
9 years 8 months ago
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
9 years 8 months ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
DSD
2007
IEEE
105views Hardware» more  DSD 2007»
9 years 8 months ago
Scaling Analytical Models for Soft Error Rate Estimation Under a Multiple-Fault Environment
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
Christian J. Hescott, Drew C. Ness, David J. Lilja
ISQED
2008
IEEE
186views Hardware» more  ISQED 2008»
9 years 9 months ago
Reliability-Aware Optimization for DVS-Enabled Real-Time Embedded Systems
—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...
Foad Dabiri, Navid Amini, Mahsan Rofouei, Majid Sa...
ICCAD
2006
IEEE
183views Hardware» more  ICCAD 2006»
9 years 11 months ago
Soft error derating computation in sequential circuits
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...
Hossein Asadi, Mehdi Baradaran Tahoori
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