IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
DFT
2005
IEEE
13 years 10 months ago
2005
IEEE
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on ...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
In this work, we experiment with complier-directed instruction duplication to detect soft errors in VLIW datapaths . In the proposed approach, the compiler determines the instruct...
ASPDAC
2006
ACM
13 years 10 months ago
2006
ACM
— Soft errors are becoming a common problem in current systems due to the scaling of technology that results in the use of smaller devices, lower voltages, and power-saving techn...
PRDC
2006
IEEE
13 years 10 months ago
2006
IEEE
As SRAM devices are scaled down, the number of variation-induced defective memory cells increases rapidly. Combination of ECC, particularly SECDED, with a redundancy technique can...
ISQED
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper proposes a simulation-based soft error estimation methodology for computer systems. Accumulating soft error rates (SERs) of all memories in a computer system results in...
IOLTS
2006
IEEE
13 years 10 months ago
2006
IEEE
A significant fraction of soft errors in modern microprocessors has been reported to never lead to a system failure. Any concurrent error detection scheme that raises alarm every ...
IISWC
2006
IEEE
13 years 10 months ago
2006
IEEE
Soft errors have become a significant concern and recent studies have measured the “architectural vulnerability factor” of systems to such errors, or conversely, the potentia...
DFT
2006
IEEE
13 years 10 months ago
2006
IEEE
Image processing systems are increasingly used in safetycritical applications, and their hardening against soft errors becomes an issue. We propose a methodology to identify soft ...