PRDC
2007
IEEE
13 years 10 months ago
2007
IEEE
As deep submicron technologies are advanced, new challenges, such as power consumption and soft errors, are emerging. A naïve technique, which utilizes emerging multicore process...
IOLTS
2007
IEEE
13 years 10 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
IEEEPACT
2007
IEEE
13 years 10 months ago
2007
IEEE
In this paper we propose a unified architectural support that can be used flexibly for either soft-error protection or software bug detection. Our approach is based on dynamically...
DDECS
2007
IEEE
13 years 10 months ago
2007
IEEE
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
DATE
2007
IEEE
13 years 10 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
DATE
2007
IEEE
13 years 10 months ago
2007
IEEE
Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can...
DSD
2009
IEEE
13 years 11 months ago
2009
IEEE
Feature sizes in VLSI circuits are steadily shrinking. This results in increasing susceptibility to soft errors, e.g. due to environmental radiation. Precautions against soft error...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—With continuous technology scaling, soft errors are becoming an increasingly important design concern even for earth-bound applications. While compiler approaches have the poten...
HPCA
2009
IEEE
13 years 11 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...