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    DAC
    2001
    ACM
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    Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
    14 years 5 months ago
    Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
    Download  esdat.ucsd.edu
    Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
    Li Chen, Xiaoliang Bai, Sujit Dey
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