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ICCAD
2009
IEEE
144views Hardware» more  ICCAD 2009»
13 years 2 months ago
Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits
In this paper, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize and monitor both inter-die and spatially-correlated intra-die va...
Xin Li, Rob A. Rutenbar, R. D. (Shawn) Blanton