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ICCD
2006
IEEE
123views Hardware» more  ICCD 2006»
10 years 6 months ago
Steady and Transient State Analysis of Gate Leakage Current in Nanoscale CMOS Logic Gates
Abstract— Gate leakage (direct tunneling current for sub65nm CMOS) can severely affect both the transient and steady state behaviors of CMOS circuits. In this paper we quantify t...
Saraju P. Mohanty, Elias Kougianos
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