ET
2007
13 years 4 months ago
2007
This article describes an emulation-based method for locating stuck-at faults in combinational and synchronous sequential circuits. The method is based on automatically designing a...
DAC
2004
ACM
13 years 8 months ago
2004
ACM
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
ICCD
1997
IEEE
13 years 8 months ago
1997
IEEE
: This paper studies pseudo-random pattern testing of bridging faults. Although bridging faults are generally more random pattern testable than stuck-at faults, examples are shown ...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
- We describe a preprocessing step to fault diagnosis of an observed response obtained from a faulty chip. In this step, a fault model for diagnosing the observed response is selec...