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VLSID
2002
IEEE
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14 years 5 months ago
Divide-and-Conquer IDDQ Testing for Core-Based System Chips
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
C. P. Ravikumar, Rahul Kumar