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    ASPDAC
    2005
    ACM
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    Bridging fault testability of BDD circuits
    13 years 6 months ago
    Bridging fault testability of BDD circuits
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    Abstract— In this paper we study the testability of circuits derived from Binary Decision Diagrams (BDDs) under the bridging fault model. It is shown that testability can be form...
    Junhao Shi, Görschwin Fey, Rolf Drechsler
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