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    IEEE
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    Power-Constrained Hybrid BIST Test Scheduling in an Abort-on-First-Fail Test Environment
    13 years 10 months ago
    Power-Constrained Hybrid BIST Test Scheduling in an Abort-on-First-Fail Test Environment
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    1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
    Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles
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