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ISCAS
2007
IEEE
128views Hardware» more  ISCAS 2007»
10 years 6 months ago
SAT-based ATPG for Path Delay Faults in Sequential Circuits
Due to the development of high speed circuits beyond the 2-GHz mark, the signi´Čücance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
Stephan Eggersglüß, Görschwin Fey,...
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