TC
2002
13 years 4 months ago
2002
ATS
2001
IEEE
13 years 8 months ago
2001
IEEE
Test access is a major problem for core-based systemon-chip (SOC) designs. Since cores in an SOC are not directly accessible via chip inputs and outputs, special access mechanisms...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
Testing embedded cores is a challenge because access to core I/Os is limited. The user-defined logic (ZJDL) surrounding the core may restrict the set of test vectors that can be a...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
ATS
2002
IEEE
13 years 9 months ago
2002
IEEE
Test planning for core-based system-on-a-chip (SOC) designs is necessary to reduce testing time and test cost. In this paper, we survey recent advances in test planning that addre...
DATE
2003
IEEE
13 years 9 months ago
2003
IEEE
One of the difficult problems which core-based systemon-chip (SoC) designs face is test access. For testing the cores in a SoC, a special mechanism is required, since they are no...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test dat...