DAC
1999
ACM
13 years 8 months ago
1999
ACM
As the family of Alpha microprocessors continues to scale into more advanced technologies with very high frequency edge rates and multiple layers of interconnect, the issue of cha...
ISQED
2005
IEEE
13 years 10 months ago
2005
IEEE
In this paper, design and measurement results of a test chip that intends to evaluate differences between layout techniques for rectangular unit-capacitor arrays are introduced. P...
GLVLSI
2006
IEEE
13 years 10 months ago
2006
IEEE
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...