ECML
2005
Springer
13 years 10 months ago
2005
Springer
We study cost-sensitive learning of decision trees that incorporate both test costs and misclassification costs. In particular, we first propose a lazy decision tree learning that ...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
ISVLSI
2008
IEEE
13 years 11 months ago
2008
IEEE
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
SAC
2009
ACM
13 years 11 months ago
2009
ACM
Software developers use testing to gain and maintain confidence in the correctness of a software system. Automated reduction and prioritization techniques attempt to decrease the...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
This paper considers reducing the cost of test application by permuting test vectors to improve their defect coverage. Algorithms for test reordering are developed with the goal o...