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ICCAD
2008
IEEE
103views Hardware» more  ICCAD 2008»
11 years 1 months ago
On capture power-aware test data compression for scan-based testing
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, ...
ICCD
2003
IEEE
130views Hardware» more  ICCD 2003»
11 years 1 months ago
On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume
This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or fr...
Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Cha...
ICCD
2004
IEEE
109views Hardware» more  ICCD 2004»
11 years 1 months ago
Low Power Test Data Compression Based on LFSR Reseeding
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
Jinkyu Lee, Nur A. Touba
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