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TVLSI
2010
9 years 9 months ago
Test Data Compression Using Efficient Bitmask and Dictionary Selection Methods
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
Kanad Basu, Prabhat Mishra
CORR
2010
Springer
152views Education» more  CORR 2010»
10 years 7 days ago
Evolutionary Approach to Test Generation for Functional BIST
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
Y. A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, Raim...
ATS
2004
IEEE
126views Hardware» more  ATS 2004»
10 years 6 months ago
Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumptio
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
Youhua Shi, Shinji Kimura, Nozomu Togawa, Masao Ya...
ASPDAC
2007
ACM
140views Hardware» more  ASPDAC 2007»
10 years 6 months ago
An Architecture for Combined Test Data Compression and Abort-on-Fail Test
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
Erik Larsson, Jon Persson
ITC
2002
IEEE
94views Hardware» more  ITC 2002»
10 years 7 months ago
Techniques to Reduce Data Volume and Application Time for Transition Test
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...
Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, P...
DFT
2002
IEEE
117views VLSI» more  DFT 2002»
10 years 7 months ago
Fast and Energy-Frugal Deterministic Test Through Test Vector Correlation Exploitation
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
Ozgur Sinanoglu, Alex Orailoglu
VTS
2003
IEEE
122views Hardware» more  VTS 2003»
10 years 8 months ago
A Reconfigurable Shared Scan-in Architecture
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
Samitha Samaranayake, Emil Gizdarski, Nodari Sitch...
ITC
2003
IEEE
205views Hardware» more  ITC 2003»
10 years 8 months ago
H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Ki...
VLSI
2005
Springer
10 years 8 months ago
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Erik Larsson, Stina Edbom
VTS
2005
IEEE
106views Hardware» more  VTS 2005»
10 years 8 months ago
Segmented Addressable Scan Architecture
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
Ahmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuc...
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