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DATE
2007
IEEE
106views Hardware» more  DATE 2007»
10 years 10 months ago
Optimized integration of test compression and sharing for SOC testing
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
DATE
2008
IEEE
112views Hardware» more  DATE 2008»
10 years 10 months ago
An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
Paolo Bernardi, Matteo Sonza Reorda
DATE
2009
IEEE
134views Hardware» more  DATE 2009»
10 years 11 months ago
A diagnosis algorithm for extreme space compaction
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
Stefan Holst, Hans-Joachim Wunderlich
ICCAD
2008
IEEE
103views Hardware» more  ICCAD 2008»
11 years 1 months ago
On capture power-aware test data compression for scan-based testing
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, ...
VLSID
2004
IEEE
93views VLSI» more  VLSID 2004»
11 years 4 months ago
Random Access Scan: A solution to test power, test data volume and test time
Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara
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