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GECCO
2006
Springer
148views Optimization» more  GECCO 2006»
9 years 2 months ago
A specification-based fitness function for evolutionary testing of object-oriented programs
Encapsulation of states in object-oriented programs hinders the search for test data using evolutionary testing. As client code is oblivious to the internal state of a server obje...
Yoonsik Cheon, Myoung Kim
AIED
2007
Springer
9 years 3 months ago
Optimizing Student Models for Causality
Complex student models often include key parameters critical to their behavior and effectiveness. For example, one meta-cognitive model of student help-seeking in intelligent tutor...
Benjamin Shih, Kenneth R. Koedinger, Richard Schei...
ICCAD
2007
IEEE
109views Hardware» more  ICCAD 2007»
9 years 3 months ago
CacheCompress: a novel approach for test data compression with cache for IP embedded cores
Abstract-- In this paper, we propose a novel test data compression technique named CacheCompress, which combines selective encoding and dynamic dictionary based encoding. Depending...
Hao Fang, Chenguang Tong, Bo Yao, Xiaodi Song, Xu ...
CP
2007
Springer
9 years 3 months ago
Exploring Different Constraint-Based Modelings for Program Verification
Recently, constraint-programming techniques have been used to generate test data and to verify the conformity of a program with its specification. Constraint generated for these ta...
Hélène Collavizza, Michel Rueher
ASPDAC
2007
ACM
140views Hardware» more  ASPDAC 2007»
9 years 3 months ago
An Architecture for Combined Test Data Compression and Abort-on-Fail Test
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
Erik Larsson, Jon Persson
ASPDAC
2007
ACM
108views Hardware» more  ASPDAC 2007»
9 years 3 months ago
RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
Hao Fang, Chenguang Tong, Xu Cheng
ITC
1993
IEEE
95views Hardware» more  ITC 1993»
9 years 3 months ago
Fault Diagnosis of Flash ADC using DNL Test
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
Anchada Charoenrook, Mani Soma
ISSTA
1998
ACM
9 years 3 months ago
Automatic Test Data Generation Using Constraint Solving Techniques
Automatic test data generation leads to identify input values on which a selected point in a procedure is executed. This paper introduces a new method for this problem based on co...
Arnaud Gotlieb, Bernard Botella, Michel Rueher
ICCD
1999
IEEE
93views Hardware» more  ICCD 1999»
9 years 3 months ago
Using an Embedded Processor for Efficient Deterministic Testing of Systems-on-a-Chip
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
Abhijit Jas, Nur A. Touba
DAC
1999
ACM
9 years 3 months ago
Microprocessor Based Testing for Core-Based System on Chip
The purpose of this paper is to develop a exible design for test methodology for testing a core-based system on chip SOC. The novel feature of the approach is the use an embedde...
Christos A. Papachristou, F. Martin, Mehrdad Noura...
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