DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
ISVC
2007
Springer
13 years 10 months ago
2007
Springer
This paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips al...
GI
2007
Springer
13 years 10 months ago
2007
Springer
: In this article we advocate an integrated approach for the automation of module or software integration testing and static analysis. It is illustrated how funmethods of static an...
KBSE
2007
IEEE
13 years 10 months ago
2007
IEEE
We explore the automatic generation of test data that respect constraints expressed in the Object-Role Modeling (ORM) language. ORM is a popular conceptual modeling language, prim...
ICSEA
2007
IEEE
13 years 10 months ago
2007
IEEE
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
DATE
2007
IEEE
13 years 10 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
CEC
2007
IEEE
13 years 10 months ago
2007
IEEE
— Generating test data for Object-Oriented (OO) software is a hard task. Little work has been done on the subject, and a lot of open problems still need to be investigated. In th...
ICST
2008
IEEE
13 years 10 months ago
2008
IEEE
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
DATE
2008
IEEE
13 years 10 months ago
2008
IEEE
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
COMPSAC
2008
IEEE
13 years 10 months ago
2008
IEEE
Path-oriented Random Testing (PRT) aims at generating a uniformly spread out sequence of random test data that activate a single control flow path within an imperative program. T...