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DATE
2006
IEEE
78views Hardware» more  DATE 2006»
9 years 5 months ago
Functional constraints vs. test compression in scan-based delay testing
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
Ilia Polian, Hideo Fujiwara
ISVC
2007
Springer
9 years 5 months ago
ChipViz : Visualizing Memory Chip Test Data
This paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips al...
Amit P. Sawant, Ravi Raina, Christopher G. Healey
GI
2007
Springer
9 years 5 months ago
Test Automation Meets Static Analysis
: In this article we advocate an integrated approach for the automation of module or software integration testing and static analysis. It is illustrated how funmethods of static an...
Jan Peleska, Helge Löding, Tatiana Kotas
KBSE
2007
IEEE
9 years 5 months ago
Scalable automatic test data generation from modeling diagrams
We explore the automatic generation of test data that respect constraints expressed in the Object-Role Modeling (ORM) language. ORM is a popular conceptual modeling language, prim...
Yannis Smaragdakis, Christoph Csallner, Ranjith Su...
ICSEA
2007
IEEE
9 years 5 months ago
Test Data Generation from UML State Machine Diagrams using GAs
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
Chartchai Doungsa-ard, Keshav P. Dahal, M. Alamgir...
DATE
2007
IEEE
106views Hardware» more  DATE 2007»
9 years 5 months ago
Optimized integration of test compression and sharing for SOC testing
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
CEC
2007
IEEE
9 years 5 months ago
A Memetic Algorithm for test data generation of Object-Oriented software
— Generating test data for Object-Oriented (OO) software is a hard task. Little work has been done on the subject, and a lot of open problems still need to be investigated. In th...
Andrea Arcuri, Xin Yao
ICST
2008
IEEE
9 years 5 months ago
Efficient Test Data Generation for Variables with Complex Dependencies
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
Armin Beer, Stefan Mohacsi
DATE
2008
IEEE
77views Hardware» more  DATE 2008»
9 years 5 months ago
Re-Examining the Use of Network-on-Chip as Test Access Mechanism
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
Feng Yuan, Lin Huang, Qiang Xu
COMPSAC
2008
IEEE
9 years 5 months ago
Constraint Reasoning in Path-Oriented Random Testing
Path-oriented Random Testing (PRT) aims at generating a uniformly spread out sequence of random test data that activate a single control flow path within an imperative program. T...
Arnaud Gotlieb, Matthieu Petit
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