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IWANN
2009
Springer
9 years 5 months ago
Aiding Test Case Generation in Temporally Constrained State Based Systems Using Genetic Algorithms
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
Karnig Derderian, Mercedes G. Merayo, Robert M. Hi...
GECCO
2009
Springer
144views Optimization» more  GECCO 2009»
9 years 5 months ago
Using automated search to generate test data for matlab
The critical functionality of many software applications relies on code that performs mathematically complex computations. However, such code is often difficult to test owing to t...
Sion Ll Rhys, Simon M. Poulding, John A. Clark
DATE
2009
IEEE
138views Hardware» more  DATE 2009»
9 years 5 months ago
Scalable Adaptive Scan (SAS)
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
Anshuman Chandra, Rohit Kapur, Yasunari Kanzawa
CSO
2009
IEEE
9 years 5 months ago
Association Rules Based Data Mining on Test Data of Physical Health Standard
With the development of modern electronic and computer technologies, sports training and competition became more and more technical. A great deal of data were recorded, including ...
Lan Yu
ICML
2007
IEEE
9 years 12 months ago
Boosting for transfer learning
Traditional machine learning makes a basic assumption: the training and test data should be under the same distribution. However, in many cases, this identicaldistribution assumpt...
Wenyuan Dai, Qiang Yang, Gui-Rong Xue, Yong Yu
DAC
2008
ACM
10 years 2 days ago
On reliable modular testing with vulnerable test access mechanisms
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
Lin Huang, Feng Yuan, Qiang Xu
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