IWANN
2009
Springer
13 years 10 months ago
2009
Springer
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
GECCO
2009
Springer
13 years 10 months ago
2009
Springer
The critical functionality of many software applications relies on code that performs mathematically complex computations. However, such code is often difficult to test owing to t...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
CSO
2009
IEEE
13 years 11 months ago
2009
IEEE
With the development of modern electronic and computer technologies, sports training and competition became more and more technical. A great deal of data were recorded, including ...
ICML
2007
IEEE
14 years 5 months ago
2007
IEEE
Traditional machine learning makes a basic assumption: the training and test data should be under the same distribution. However, in many cases, this identicaldistribution assumpt...
DAC
2008
ACM
14 years 5 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...