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    DATE
    2000
    IEEE
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    A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects
    13 years 9 months ago
    A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects
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    Delay defects on I/O pads, interconnections of a board, or interconnections among embedded cores can not be tested with the current IEEE 1149.1 boundary scan design. This paper in...
    Sungju Park, Taehyung Kim
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