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    DATE
    2007
    IEEE
    155views Hardware» more  DATE 2007»
    Design fault directed test generation for microprocessor validation
    13 years 10 months ago
    Design fault directed test generation for microprocessor validation
    Download  www.arctic.umn.edu
    Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
    Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
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