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EURODAC
1995
IEEE
126views VHDL» more  EURODAC 1995»
9 years 2 months ago
Quality considerations in delay fault testing
We examine delay models used in VLSI circuit testing. Our study includes electrical-level simulation experiments with HSPICE. We show phenomena which signi cantly a ect the actual...
Alicja Pierzynska, Slawomir Pilarski
DAC
2003
ACM
9 years 4 months ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
ATS
2009
IEEE
132views Hardware» more  ATS 2009»
9 years 6 months ago
On Improving Diagnostic Test Generation for Scan Chain Failures
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
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