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JSA
2000
103views more  JSA 2000»
9 years 10 months ago
Testing and built-in self-test - A survey
As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...
Andreas Steininger
ITC
2003
IEEE
123views Hardware» more  ITC 2003»
10 years 3 months ago
A Comprehensive Approach to Assessing and Analyzing 1149.1 Test Logic
In this paper we introduce a tool which is capable of verifying an 1149.1 test logic implementation and its compliance to the IEEE 1149.1 Standard [1][2] while providing a precise...
Kevin Melocco, Hina Arora, Paul Setlak, Gary Kunse...
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