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ASPDAC
2005
ACM
107views Hardware» more  ASPDAC 2005»
13 years 6 months ago
Constraint extraction for pseudo-functional scan-based delay testing
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
Yung-Chieh Lin, Feng Lu, Kai Yang, Kwang-Ting Chen...
DATE
2008
IEEE
123views Hardware» more  DATE 2008»
13 years 11 months ago
Test Strategies for Low Power Devices
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...
C. P. Ravikumar, M. Hirech, X. Wen