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    IWANN
    1995
    Springer
    137views Neural Networks» more  IWANN 1995»
    Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms
    13 years 8 months ago
    Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms
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    This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
    José Luis Bernier, Juan J. Merelo Guerv&oac...
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