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TCAD
1998
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13 years 3 months ago
Test-point insertion: scan paths through functional logic
—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Kwang-T...