TEC
2010
12 years 11 months ago
2010
In some expensive multiobjective optimization problems, several function evaluations can be carried out at one time. Therefore, it is very desirable to develop methods which can g...
NECO
2000
13 years 4 months ago
2000
The Bayesian committee machine (BCM) is a novel approach to combining estimators which were trained on different data sets. Although the BCM can be applied to the combination of a...
KDD
2000
ACM
13 years 8 months ago
2000
ACM
In this paper we introduce the Generalized Bayesian Committee Machine (GBCM) for applications with large data sets. In particular, the GBCM can be used in the context of kernel ba...
ITC
1994
IEEE
13 years 8 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
VTS
1996
IEEE
13 years 8 months ago
1996
IEEE
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
ITC
1999
IEEE
13 years 8 months ago
1999
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...