DATE
2004
IEEE
13 years 8 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
Adaptive testing is a generic term for a number of techniques which aim at improving the test quality and/or reducing the test application costs. In adaptive tests, the test conte...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
VLSI
2005
Springer
13 years 9 months ago
2005
Springer
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...