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ATS
2001
IEEE
172views Hardware» more  ATS 2001»
13 years 8 months ago
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih...
ASPDAC
2007
ACM
101views Hardware» more  ASPDAC 2007»
13 years 8 months ago
Core-Based Testing of Multiprocessor System-on-Chips Utilizing Hierarchical Functional Buses
Abstract--An integrated test scheduling methodology for multiprocessor System-on-Chips (SOC) utilizing the functional buses for test data delivery is described. The proposed method...
Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orail...
ICCD
2003
IEEE
89views Hardware» more  ICCD 2003»
13 years 9 months ago
Power-Time Tradeoff in Test Scheduling for SoCs
We present a test scheduling methodology for core-based system-on-chips that allows tradeoff between system power dissipation and overall test time. The basic strategy is to use t...
Mehrdad Nourani, James Chin