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    DATE
    2007
    IEEE
    106views Hardware» more  DATE 2007»
    Optimized integration of test compression and sharing for SOC testing
    13 years 11 months ago
    Optimized integration of test compression and sharing for SOC testing
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    1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
    Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
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