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DATE
2007
IEEE
106views Hardware» more  DATE 2007»
10 years 3 months ago
Optimized integration of test compression and sharing for SOC testing
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
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