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VTS
1997
IEEE
96views Hardware» more  VTS 1997»
9 years 14 days ago
Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
ATS
1998
IEEE
76views Hardware» more  ATS 1998»
9 years 17 days ago
Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
Michael S. Hsiao, Srimat T. Chakradhar
ADAEUROPE
2001
Springer
9 years 24 days ago
Testing from Formal Specifications, a Generic Approach
Deriving test cases from specifications is now recognised as a major application of formal methods to software development. Several methods have been proposed for various formalism...
Marie-Claude Gaudel
ITC
2002
IEEE
72views Hardware» more  ITC 2002»
9 years 1 months ago
Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...
M. J. Geuzebroek, J. Th. van der Linden, A. J. van...
DATE
2002
IEEE
114views Hardware» more  DATE 2002»
9 years 1 months ago
Test Enrichment for Path Delay Faults Using Multiple Sets of Target Faults
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
Irith Pomeranz, Sudhakar M. Reddy
ITC
2003
IEEE
139views Hardware» more  ITC 2003»
9 years 1 months ago
A Hybrid Coding Strategy For Optimized Test Data Compression
Store-and-generate techniques encode a given test set and regenerate the original test set during the test with the help of a decoder. Previous research has shown that runlength c...
Armin Würtenberger, Christofer S. Tautermann,...
ICDAR
2003
IEEE
9 years 1 months ago
Towards a Ptolemaic Model for OCR
In style-constrained classification often there are only a few samples of each style and class, and the correspondences between styles in the training set and the test set are un...
Sriharsha Veeramachaneni, George Nagy
SAT
2004
Springer
75views Hardware» more  SAT 2004»
9 years 1 months ago
The Second QBF Solvers Comparative Evaluation
This paper reports about the 2004 comparative evaluation of solvers for quantified Boolean formulas (QBFs), the second in a series of non-competitive events established with the a...
Daniel Le Berre, Massimo Narizzano, Laurent Simon,...
ASPDAC
2004
ACM
102views Hardware» more  ASPDAC 2004»
9 years 1 months ago
TranGen: a SAT-based ATPG for path-oriented transition faults
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
Kai Yang, Kwang-Ting Cheng, Li-C. Wang
IUI
2005
ACM
9 years 1 months ago
Multimodal new vocabulary recognition through speech and handwriting in a whiteboard scheduling application
Our goal is to automatically recognize and enroll new vocabulary in a multimodal interface. To accomplish this our technique aims to leverage the mutually disambiguating aspects o...
Edward C. Kaiser
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