Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
Deriving test cases from specifications is now recognised as a major application of formal methods to software development. Several methods have been proposed for various formalism...
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...
M. J. Geuzebroek, J. Th. van der Linden, A. J. van...
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
Store-and-generate techniques encode a given test set and regenerate the original test set during the test with the help of a decoder. Previous research has shown that runlength c...
In style-constrained classification often there are only a few samples of each style and class, and the correspondences between styles in the training set and the test set are un...
This paper reports about the 2004 comparative evaluation of solvers for quantified Boolean formulas (QBFs), the second in a series of non-competitive events established with the a...
Daniel Le Berre, Massimo Narizzano, Laurent Simon,...
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
Our goal is to automatically recognize and enroll new vocabulary in a multimodal interface. To accomplish this our technique aims to leverage the mutually disambiguating aspects o...