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DATE
2008
IEEE
84views Hardware» more  DATE 2008»
9 years 4 months ago
Physically-Aware N-Detect Test Pattern Selection
N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of Ndetect test do not necessarily exploit the localized characte...
Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D...
ICCAD
2001
IEEE
84views Hardware» more  ICCAD 2001»
9 years 7 months ago
On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
Seiji Kajihara, Kohei Miyase
KDD
2002
ACM
108views Data Mining» more  KDD 2002»
9 years 10 months ago
Incremental Machine Learning to Reduce Biochemistry Lab Costs in the Search for Drug Discovery
This paper promotes the use of supervised machine learning in laboratory settings where chemists have a large number of samples to test for some property, and are interested in id...
George Forman
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