Sciweavers

ICTAI
2005
IEEE
13 years 9 months ago
Using a Lagrangian Heuristic for a Combinatorial Auction Problem
In this paper, a combinatorial auction problem is modeled as a NP-complete set packing problem and a Lagrangian relaxation based heuristic algorithm is proposed. Extensive experim...
Yunsong Guo, Andrew Lim, Brian Rodrigues, Jiqing T...
DATE
2005
IEEE
172views Hardware» more  DATE 2005»
13 years 9 months ago
Evolutionary Optimization in Code-Based Test Compression
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...
Ilia Polian, Alejandro Czutro, Bernd Becker
DFT
2006
IEEE
105views VLSI» more  DFT 2006»
13 years 9 months ago
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinge...
DATE
2006
IEEE
134views Hardware» more  DATE 2006»
13 years 9 months ago
Power constrained and defect-probability driven SoC test scheduling with test set partitioning
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
Zhiyuan He, Zebo Peng, Petru Eles
CRV
2006
IEEE
99views Robotics» more  CRV 2006»
13 years 9 months ago
The McGill Object Detection Suite
Evaluation of object detection systems requires a set of test images with objects in heterogeneous scenes. Unfortunately, existing publicly available object databases provide few,...
Donovan H. Parks, Martin D. Levine
SEMWEB
2007
Springer
13 years 9 months ago
Results of the Ontology Alignment Evaluation Initiative 2007
Abstract. Ontology matching consists of finding correspondences between ontology entities. OAEI campaigns aim at comparing ontology matching systems on precisely defined test set...
Jérôme Euzenat, Antoine Isaac, Christ...
GI
2007
Springer
13 years 9 months ago
Industrial Requirements to Benefit from Test Automation Tools for GUI Testing
: In addition to the growing complexity of software systems, test effort takes increasing amounts of time and correspondingly more money. Testing costs may be reduced without compr...
Christof J. Budnik, Rajesh Subramanyan, Marlon Vie...
CLEAR
2007
Springer
140views Biometrics» more  CLEAR 2007»
13 years 9 months ago
The Rich Transcription 2007 Meeting Recognition Evaluation
We present the design and results of the Spring 2007 (RT-07) Rich Transcription Meeting Recognition Evaluation; the fifth in a series of community-wide evaluations of language tech...
Jonathan G. Fiscus, Jerome Ajot, John S. Garofolo
DSD
2009
IEEE
85views Hardware» more  DSD 2009»
13 years 10 months ago
Thermal-Aware Test Scheduling for Core-Based SoC in an Abort-on-First-Fail Test Environment
—Long test application time and high temperature have become two major issues of system-on-chip (SoC) test. In order to minimize test application times and avoid overheating duri...
Zhiyuan He, Zebo Peng, Petru Eles
DATE
2009
IEEE
106views Hardware» more  DATE 2009»
13 years 10 months ago
Generation of compact test sets with high defect coverage
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
Xrysovalantis Kavousianos, Krishnendu Chakrabarty