DELTA
2006
IEEE
13 years 10 months ago
2006
IEEE
— Design, Verification and Test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnost...
ICCAD
2004
IEEE
14 years 1 months ago
2004
IEEE
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...