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2000
IEEE
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8 years 10 months ago
On Testing the Path Delay Faults of a Microprocessor Using its Instruction Set
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...
Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng
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